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Search for "scanning parameter" in Full Text gives 1 result(s) in Beilstein Journal of Nanotechnology.

Quantitative wear evaluation of tips based on sharp structures

Ke Xu and
Houwen Leng

Beilstein J. Nanotechnol. 2024, 15, 230–241, doi:10.3762/bjnano.15.22

scanning frequency and free amplitude, and a set point of approximately 0.2, resulting in clear, high-quality AFM images. Keywords: atomic force microscopy; estimated tip diameter; scanning parameter; tip reconstruction; tip wear; Introduction AFM is a commonly used multifunctional technology in

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Figure 1: Principle of AFM tip morphology extraction from sharp structures.

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Figure 2: Flowchart for the characterization of tip morphology using sharp structures.

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Figure 3: Extraction of scan line feature points.

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Figure 4: Simulated tip scanning of samples in tapping mode. (a) Blunt tip, (b) sharp tip, (c, d) sharp struc...

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Figure 5: AFM scan images of the TipCheck sample. (a) 2D topography image and (b) 3D topography image.

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Figure 6: Extraction of scan line feature points.

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Figure 7: SEM images of AFM tips. (a) Image of tip and cantilever beam and (b) image of the tip; the dotted f...

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Figure 8: Reconstructed probe model. (a) Reconstructed 3D model of the tip and (b) reconstructed probe contou...

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Figure 9: Changes of the ETD determined with AFM and SEM.

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Figure 10: Wear test procedure. (a) 3D reconstruction of the tip topography with the TipCheck sample before sc...

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Figure 11: Influence of free amplitude on ETD and R_a. (a) ETD changes at free amplitudes of 200, 250, and 300 ...

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Figure 12: Influence of the scanning frequency on ETD and R_a. (a) ETD changes at line scanning frequencies of ...

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Figure 13: Influence of set point on ETD and R_a. (a) ETD changes at set points of 0.2, 0.5, and 0.8. (b) R_a ch...

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Figure 14: AFM image changes under different scanning parameters. (a) 0 h scan with low-wear settings, (b) 5 h...

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Published 14 Feb 2024

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